<XML><RECORDS><RECORD><REFERENCE_TYPE>10</REFERENCE_TYPE><REFNUM>6639</REFNUM><AUTHORS><AUTHOR>Cockshott,W.P.</AUTHOR><AUTHOR>Cowie,A.J.</AUTHOR><AUTHOR>Russell,G.W.</AUTHOR><AUTHOR>Mcgregor,D.</AUTHOR></AUTHORS><YEAR>1993</YEAR><TITLE>Memory resident databases: reliability, compression and performance</TITLE><PLACE_PUBLISHED> </PLACE_PUBLISHED><PUBLISHER>University of Strathclyde</PUBLISHER><PAGES>1..30</PAGES><ISBN>arch-11-93</ISBN><LABEL>Cockshott:1993:6639</LABEL><KEYWORDS><KEYWORD>compression</KEYWORD></KEYWORDS<ABSTRACT>This paper argues that recent developments in non-volatile solid state store allow a new implementation paradigm for databases. This involves replacing slow rotating storage with all-semiconductor stores. A mechanism is presented for achieving high reliability with this medium. The relatively higher costs of semi-conductor store make data compression advantageous. It is argued that relational databases are well suited to this. </ABSTRACT></RECORD></RECORDS></XML>