<XML><RECORDS><RECORD><REFERENCE_TYPE>3</REFERENCE_TYPE><REFNUM>8860</REFNUM><AUTHORS><AUTHOR>Reid,D.</AUTHOR><AUTHOR>Millar,C.</AUTHOR><AUTHOR>Asenov,A.</AUTHOR><AUTHOR>Roy,S.</AUTHOR><AUTHOR>Roy,G.</AUTHOR><AUTHOR>Sinnott,R.O.</AUTHOR><AUTHOR>Stewart,G.</AUTHOR></AUTHORS><YEAR>2008</YEAR><TITLE>Supporting Statistical Semiconductor Device Analysis using EGEE and OMII-UK Middleware</TITLE><PLACE_PUBLISHED>Proceedings of EGEE User Conference, Clermont-Ferrand, February 2008.</PLACE_PUBLISHED><PUBLISHER>N/A</PUBLISHER><LABEL>Reid:2008:8860</LABEL></RECORD></RECORDS></XML>