<XML><RECORDS><RECORD><REFERENCE_TYPE>3</REFERENCE_TYPE><REFNUM>8862</REFNUM><AUTHORS><AUTHOR>Millar,C.</AUTHOR><AUTHOR>Asenov,A.</AUTHOR><AUTHOR>Roy,G.</AUTHOR><AUTHOR>Roy,S.</AUTHOR><AUTHOR>Cumming,D.</AUTHOR><AUTHOR>Berry,D.</AUTHOR><AUTHOR>Pickles,S.</AUTHOR><AUTHOR>Furber,S.</AUTHOR><AUTHOR>Murray,A.</AUTHOR><AUTHOR>Tyrrell,A.</AUTHOR><AUTHOR>Zwolinski,M.</AUTHOR><AUTHOR>Sinnott,R.O.</AUTHOR></AUTHORS><YEAR>2008</YEAR><TITLE>Meeting the Design Challenges of nano-CMOS Electronics</TITLE><PLACE_PUBLISHED>Proceedings of Design Automation and Test in Europe: Workshop on Impact of Process Variability on Design and Test, Munich, Germany, March 2008.</PLACE_PUBLISHED><PUBLISHER>N/A</PUBLISHER><LABEL>Millar:2008:8862</LABEL></RECORD></RECORDS></XML>